Time-resolved double-slit interference pattern measurement with entangled photons

P Kolenderski, C Scarcella, K Johnsen, D Hamel, Catherine Holloway, K Shalm, S Tisa, A Tosi, K Resch, T Jennewein
in 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013, Conference paper (text)

Abstract

The essence of wave-particle duality is that particles passing through slits form a pattern that can only be explained by resorting to wave mechanics. Here we present results that provide insight into the buildup of the multiple-slit interference pattern. The perfect time resolved measurements would ideally involve a single-particle source and an array of single-particle noiseless detectors featuring perfect quantum efficiency and time resolution. In previous experiments for electrons [1], photons [2] and molecules [3], detection of single particles was limited by minimum acquisition times, thus denying access to precise timing information. We make a significant step forward, approaching the perfect measurement very closely and showing real-time interference pattern buildup of singlephoton detections as a result of passing through a system of multiple slits. These measurements accessed precise timing information, allowing us to analyse the interference pattern's formation process and effects of entanglement. © 2013 IEEE.